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Polymer Interphases Consortium

In Colaboration With: Polymers Division Surface & Microanalysis Science Division Materials Science & Engineering Laboratory Chemical Science & Technology Laboratory

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Topics PIC Home PIC Workshop (1/16/08) Phase II (started 10/1/04) Members-Only Site Links Publications Contacts

NIST/Industry Polymer Interphase Consortium (PIC) Workshop - January 16, 2008 Objective To hold discussions with prospective industrial partners on areas of interest in the field of polymer surfaces, interfaces, and interphases. Prospective Research Topics: Development of new methods for:chemical, optical, and mechanical characterization of polymer surface, interfaces/interphases. Relevant Applications: Automotive Coatings and Plastics; Architectural Coatings; Scratch Resistant Coatings; Smart Coatings; Impact Modified Thermoplastics; Multifunctional, Multi-phase Materials. With input from interested industrial partners, we will shape our research plans to develop new methods for chemical, optical, and mechanical characterization of polymer interfaces. In particular, we are interested in combining these technologies to relate material properties to performance. Meeting Presentations (Adobe PDF Format) PIC Workshop Agenda-January 16, 2008 NIST Management’s Request for Industrial Feedback on the Research Direction of PIC and the Polymer Materials Group (Jon Martin, Division Chief, Materials and Construction Research Div., BFRL) Report on last two phases of PIC and prospect of future (Lipiin Sung, Acting NIST/PIC Director) Improvements Required in Automotive Plastic Components - Surfaces, Interphases, and Interfaces (Rose Ryntz, IAC Group North America) Army perspective on surfaces, interfaces and interphases (Mark VanLandingham, Army Research Lab) Dynamic polymer measurements using indentation ( Erik Herbert, MTS Nanoinstrument) Eastman Current research areas & future interests (Kevin McCreight, Eastman Chemical) Multi-Walled Carbon Nanotubes (Page McAndrew, Arkema Inc. ) NIST measurement capabilities and proposed research-I (Aaron Forster,BFRL) NIST measurement capabilities and proposed research-II (Chris Michaels, CSTL) NIST measurement capabilities and proposed research-III (Jeff Bullard,BFRL) NIST measurement capabilities and proposed research-IV (LiPiin Sung, BFRL) Industrial presenation-I (Edmund Lau, Solvay Engineered Polymers) Industrial presenation-II (Greg Blackman, DuPont) PIC Workshop presentations more to come !

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