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Measurement Science for Optical Reflectance and Scattering


Workshop on Metrology and Modeling of Color and Appearance -- Workshop Presentations

Workshop Home Program Schedule


Author Organization Presentation Title
Kristin Dana Rutgers University Models and Measurements of 3D Texture
Thomas Germer NIST Modeling and Measurements for Light Scattering from Smooth Surfaces
Robert Gettings NIST An Overview of NIST Measurement Services
Leonard Hanssen NIST NIST-Industry Consortium on Optical Properties of Materials
Richard Harold Color and Appearance Consulting LLC Color and Appearance Attributes
Fern Hunt NIST The Role of Modeling and Rendering in the NIST Optical Reflectance Project
Frank J. Iannarilli, Jr. Aerodyne Research, Inc. Appearance Engineering: Getting from Virtual Models to Physical Designs
Jim Jafolla Surface Optics Corporation Phenomenological BRDF Modeling for Engineering Applications
Terry Lynch NIST Opportunities for NIST/Industry Partnerships
Charles G. Leete Collaborative Testing Services, Inc. Evaluating Color Instrument Performance Using Large Scale Studies
Egon Marx NIST Surface Characterization and Modeling for Coatings
Calvin S. McCamy Consultant Appearance Attributes of Metallic Paints and Plastics
Gary Meyer University of Oregon An Appearance Based Rendering System
Maria Nadal NIST Optical Measurements and Standard Materials for Color and Appearance
Marc Olano Silicon Graphics, Inc. Interactive Realism with Multi-Pass Rendering
James Roberts DURON Color Matching Problems in the Paint Industry
Barry Rubin DuPont Company Predicting Optical Properties of Synthetic Fibers
Holly Rushmeier IBM Appearance Issues for Electronic Commerce
Art Springsteen Avian Technologies An Introduction to Measurement of Color of Fluorescent Materials and Fluorescence Standards
Joe Stam Alias|Wavefront Computer Rendering Of Anisotropic Surfaces
Li-Piin Sung NIST Characterizing Coating Microstructure
Paul Tannenbaum DuPont Company Development of New Appearance Measurement Procedures for Coated Materials - The E12.14 Approach

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Date created: 9/01/2000
Last updated: 7/12/2002