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Measurement Science for Optical Reflectance and Scattering

Technical Strategy

The appearance of an object is determined by a complex interaction of

  • light incident upon an object
  • scattering and absorption properties of the object
  • human perception

These interactions are generally categorized into spectral (color) and spatial (gloss, texture, etc.) phenomena.

Current appearance characterization techniques are usually directed toward a particular appearance attribute, such as specular gloss, haze, or color. This approach has led to a host of specialized metrics – at least ten for gloss alone – that are useful in monitoring the day-to-day quality of some products but are inadequate for characterizing many materials. For example, these metrics are inadequate for characterizing angle resolved scattering such as the bidirectional reflection distribution function, for measuring interactions of more than one appearance attribute, for characterizing surface texture or for describing optical properties with adequate precision to meet the needs of some modern manufacturing requirements.

In this research, a systems approach that applies advances of the past three decades in optical measurements, mathematical modeling, and computer rendering is being used to develop new methods of characterizing reflectance and scattering properties and more accurate methods of modeling the optical properties of materials. Application of advanced optical technologies, such as goniophotometric systems and imaging, coupled with advanced computational technology will result in a more comprehensive understanding of reflectance parameters. New detector technologies also offer the potential of making low-cost, image-based instruments to measure optical properties of materials. Parameterized mathematical models and computer rendering, when coupled with advanced measurements, will allow researchers and engineers to assess the contribution of a material’s constituents to its optical properties and help them design materials with desired optical properties.

 

Workshop Presentations

March 2000 Workshop on Metrology and Modeling of Color and Appearance

 


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Date created: 9/01/2000
Last updated: 7/12/2002