 |
|
|
|
|
|
|
|
|
|
|
 |
 |
 |
 |
|||||||
 |
||||||||||
 |
 |
 |
 |
 |
 |
 |
 |
|||
Measurement Science for Optical Reflectance and Scattering
Meetings
On March 29 and 30, 2000, NIST hosted a two-day multi-disciplinary workshop on measurement and modeling of color and appearance of materials. The workshop provided attendees an opportunity to learn about current and anticipated needs for improved appearance measurements, new measurement and modeling developments, research aimed at improving the fundamental understanding of factors affecting appearance of materials, and predictive computer rendering based on optical scattering of objects. The workshop explored common needs of industry for improved measurements, modeling, and prediction of appearance parameters through panel discussions. Panel recommendations are being used to guide the direction of future color and appearance research programs at NIST.
- 1996 Workshop on Advance Methods and Models for Appearance of Coatings and Coated Objects, Summary published in NISTIR 5952 (1997).
|
Privacy Statement/Security Notice | Disclaimer | FOIA NIST is an agency of the U.S. Department of Commerce
|
|
For more information, contact: bfrlwebmaster@nist.gov
Date created: 9/01/2000
Last updated: 7/12/2002